Software
Kinemate® 8.0 for Defect Review
Commitment to Excellence The latest release of Kinemate® Defect Review Software represents Kinetek's "Commitment to Excellence" program of continual product development. The widely acclaimed, fast, versatile user interface has been continuously improved over the years by working closely with our customers. In keeping with the modular software architecture, Kinemate® 8.0 now offers additional third party microscope, robot, and stage support as well as support for additional defect file formats.	Click thumbnail to see the full-sized image
Powerful defect navigation Kinemate is an advanced operator interface for review and classification of defects on patterned or patternless wafers and substrates. The application can be customized for the operator in either a production or test and analysis environment.
User-friendly  Special wizards simplify teaching wafer maps for your products. The user-friendly graphical interface will please your operators, increase their productivity, and reduce your costs.
Imaging Options  Still images can be acquired and stored locally or on a remote network drive. Interfaces are available for most image archiving systems and yield management tools. "Live video in a window" is a popular option.
Standard file formats  Kinemate reads any major defect file format. Defects can be classified with the press of a single button. The results then are saved in the original defect files.
Versatile  Kinemate can control the stage for navigation on a number of analysis and review tools, such as optical microscopes on review stations, SEM, FIB, and EDS tools. This gives you a complete, versatile application you can use throughout your facility, whether for in-line processing or off-line failure analysis. Choosing identical user interfaces throughout your facility can significantly reduce operator learning curve and confusion.