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Kinetek First Optical Inspection 2.2


Post-probe inspection  Kinetek First Optical Inspection (FOI) 2.2 combines many of the features found in Kinetek Inspection 4.1 and Kinetek Inkless Inspection 2.0, allowing for post-probe inspection with die binning capability. 
FOI reads and writes to a variety of file formats such as case KLA SINF and INF.

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foi.jpg (58321 bytes)
User-friendly interface  Special wizards simplify teaching wafer maps and inspection routines. The user-friendly graphical interface will please your operators, increase their productivity, and reduce your costs.
Imaging Options  Still images can be acquired and stored locally or on a remote network drive. Interfaces are available for most image archiving systems and yield management tools. "Live video in a window" is a popular option.
 
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